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Analysis of XRD stress measurement data of naturally grown oxide films Al2O3 and Cr2O3 based on existing Reuss, Voigt, and Hill models

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dc.contributor.authorSARIOĞLU, CEVAT
dc.contributor.authorsSarioglu, C
dc.date.accessioned2022-03-12T16:58:54Z
dc.date.available2022-03-12T16:58:54Z
dc.date.issued2002
dc.description.abstractThe resistance of naturally grown alumina (Al2O3) and chromia (Cr2O3) scales to cracking and spalling under influence of growth and thermal stresses is a critical aspect of the environmental resistance of high temperature alloys such as Fe and Ni based alloys. The driving force for scale failure is the residual stress developed in the scale. In this study, strain and stress measurement techniques by XRD were reviewed. XRD data for Al2O3 and Cr2O3 films were analysed and discussed with respect to existing models. It was experimentally found that the Reuss model provided the best description of the measured strain data for these films. Strain and stress states of Al2O3 and Cr2O3 films here determined. (C) 2002 IoM Communications Ltd.
dc.identifier.doi10.1179/026708402225002767
dc.identifier.issn0267-0844
dc.identifier.urihttps://hdl.handle.net/11424/227120
dc.identifier.wosWOS:000175935000004
dc.language.isoeng
dc.publisherMANEY PUBLISHING
dc.relation.ispartofSURFACE ENGINEERING
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectRESIDUAL-STRESS
dc.titleAnalysis of XRD stress measurement data of naturally grown oxide films Al2O3 and Cr2O3 based on existing Reuss, Voigt, and Hill models
dc.typearticle
dspace.entity.typePublication
local.avesis.id40059a90-28fc-4443-a00a-8291d7f3140e
local.import.packageSS17
local.indexed.atWOS
local.indexed.atSCOPUS
local.journal.numberofpages7
oaire.citation.endPage111
oaire.citation.issue2
oaire.citation.startPage105
oaire.citation.titleSURFACE ENGINEERING
oaire.citation.volume18
relation.isAuthorOfPublication6ec6d31d-4f25-485a-b1ea-0fe14f90a990
relation.isAuthorOfPublication.latestForDiscovery6ec6d31d-4f25-485a-b1ea-0fe14f90a990

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