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High-temperature stress measurements during the oxidation of NiAl

dc.contributor.authorSARIOĞLU, CEVAT
dc.contributor.authorsSchumann E., Sarioglu C., Blachere J.R., Pettit F.S., Meier G.H.
dc.date.accessioned2022-03-15T01:54:00Z
dc.date.available2022-03-15T01:54:00Z
dc.date.issued2000
dc.description.abstractThe growth stresses in α-alumina scales growing on stoichiometric NiAl during oxidation in air at 1100 °C have been measured by two X-ray diffraction techniques: the classic rocking technique and a newly developed fixed-incidence multiplane (FIM) technique. The growth stresses were found to be within the experimental uncertainty of the measurements, i.e., near zero. Measurement of the residual stresses using an optical-fluorescence spectroscopy (OFS) technique in adherent regions of the scale, after cooling to room temperature, were consistent with the growth stresses having been negligibly small. These measurements contrast with previous measurements of growth stresses in α-alumina growing on Fe-Cr-Al alloys, using the FIM technique, which indicated compressive growth stresses on the order of 1 GPa. Possible reasons for these differences are discussed.
dc.identifier.doi10.1023/a:1004585003083
dc.identifier.issn0030770X
dc.identifier.urihttps://hdl.handle.net/11424/246447
dc.language.isoeng
dc.publisherKluwer Academic/Plenum Publ Corp, New York
dc.relation.ispartofOxidation of Metals
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.titleHigh-temperature stress measurements during the oxidation of NiAl
dc.typearticle
dspace.entity.typePublication
local.avesis.id8e3343ff-e6ad-4905-94fd-6c928a042055
local.import.packageSS21
local.import.sourceScopus
local.indexed.atSCOPUS
oaire.citation.endPage272
oaire.citation.issue3
oaire.citation.startPage259
oaire.citation.titleOxidation of Metals
oaire.citation.volume53
relation.isAuthorOfPublication6ec6d31d-4f25-485a-b1ea-0fe14f90a990
relation.isAuthorOfPublication.latestForDiscovery6ec6d31d-4f25-485a-b1ea-0fe14f90a990

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