Publication: A Screen-Printed Nickel Based Resistance Temperature Detector (RTD) on Thin Ceramic Substrate
| dc.contributor.authors | Turkani V.S., Maddipatla D., Narakathu B.B., Altay B.N., Fleming D., Bazuin B.J., Atashbar M.Z. | |
| dc.date.accessioned | 2022-03-15T02:15:23Z | |
| dc.date.accessioned | 2026-01-11T15:57:33Z | |
| dc.date.available | 2022-03-15T02:15:23Z | |
| dc.date.issued | 2020 | |
| dc.description.abstract | A flexible nickel (Ni) based resistance temperature detector (RTD) was successfully fabricated for monitoring temperature in automobile and aerospace applications. The RTD was developed by screen printing Ni based ink on a flexible ceramic platform. The ability of the RTD to monitor temperatures varying from 25°C to 200°C, in steps of 25°C was investigated. The results of the RTD demonstrated a linear response with resistive changes as high as 47.1% at 200 °C, when compared to its base resistance (20.2 kΩ) at 25 °C. A temperature coefficient of resistance (TCR) of 0.3%/°C, with a correlation coefficient of 0.9994 was calculated for the RTD. The response of the screen printed RTD is analyzed and presented in this paper. © 2020 IEEE. | |
| dc.identifier.doi | 10.1109/EIT48999.2020.9208252 | |
| dc.identifier.isbn | 9781728153179 | |
| dc.identifier.issn | 21540357 | |
| dc.identifier.uri | https://hdl.handle.net/11424/248119 | |
| dc.language.iso | eng | |
| dc.publisher | IEEE Computer Society | |
| dc.relation.ispartof | IEEE International Conference on Electro Information Technology | |
| dc.rights | info:eu-repo/semantics/closedAccess | |
| dc.subject | ceramic substrate | |
| dc.subject | flexible | |
| dc.subject | nickel | |
| dc.subject | resistive temperature detector (RTD) | |
| dc.subject | screen printing | |
| dc.title | A Screen-Printed Nickel Based Resistance Temperature Detector (RTD) on Thin Ceramic Substrate | |
| dc.type | conferenceObject | |
| dspace.entity.type | Publication | |
| oaire.citation.endPage | 580 | |
| oaire.citation.startPage | 577 | |
| oaire.citation.title | IEEE International Conference on Electro Information Technology | |
| oaire.citation.volume | 2020-July |
