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PIXE, Particel Induced X-ray Emission a concise review

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dc.contributor.authorsGarip A.I.
dc.date.accessioned2022-03-28T14:50:23Z
dc.date.accessioned2026-01-11T16:26:49Z
dc.date.available2022-03-28T14:50:23Z
dc.date.issued1998
dc.description.abstractPIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-destructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.
dc.identifier.issn13000527
dc.identifier.urihttps://hdl.handle.net/11424/255419
dc.language.isoeng
dc.relation.ispartofTurkish Journal of Chemistry
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectElemental analysis
dc.subjectIon induced X-ray
dc.subjectParticle induced X-ray emission
dc.subjectTrace element
dc.titlePIXE, Particel Induced X-ray Emission a concise review
dc.typereview
dspace.entity.typePublication
oaire.citation.endPage199
oaire.citation.issue3
oaire.citation.startPage183
oaire.citation.titleTurkish Journal of Chemistry
oaire.citation.volume22

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