Publication:
Examining Thread Vulnerability analysis using fault-injection

dc.contributor.authorsOz I., Topcuoglu H.R., Kandemir M., Tosun O.
dc.date.accessioned2022-03-15T02:09:59Z
dc.date.accessioned2026-01-11T15:34:00Z
dc.date.available2022-03-15T02:09:59Z
dc.date.issued2013
dc.description.abstractWith the scale down of transistor sizes and higher frequencies with low power modes in modern architectures, the chip components become more susceptible to transient errors. Concurrently, multicore machines are replacing traditional single-core machines in most application domains. Thread Vulnerability Factor (TVF) is a metric to evaluate relative soft error vulnerability of multithreaded applications running on multicore architectures. It makes possible vulnerability analysis of parallel programs by providing comparisons between them. In this work, we design a simulation-based fault-injection framework to evaluate soft error vulnerability of parallel applications and perform a validation study to evaluate parallel program vulnerability. The results of the simulation-based fault injection framework is compared with the results based on TVF analysis. Our results demonstrate that TVF provides an efficient vulnerability analysis by having the same ordering and similar vulnerability rates with fault-injection results for a set of multithreaded applications. © 2013 IEEE.
dc.identifier.doi10.1109/VLSI-SoC.2013.6673282
dc.identifier.isbn9781479905249
dc.identifier.issn23248432
dc.identifier.urihttps://hdl.handle.net/11424/247371
dc.language.isoeng
dc.publisherIEEE Computer Society
dc.relation.ispartofIEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.titleExamining Thread Vulnerability analysis using fault-injection
dc.typeconferenceObject
dspace.entity.typePublication
oaire.citation.endPage245
oaire.citation.startPage240
oaire.citation.titleIEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC

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