Scanning electron microscopic examination of different cleaners: Surface contaminant removal from dentures

Abstract

Dentures were examined by scanning electron microscopy to evaluate removal of surface contaminants. Five complete dentures were obtained during patient appointments. The palatal surface of each denture was divided into eight pieces (1 cm(2)) then each sample cleaned with Corega(R), Dentipur(R), Fittydent(R), sodium hypochloride, Savlon(R), Ipanol(R), brushing methods and one sample was also kept as a control. They were prepared for SEM examination and photographed at X500. One photograph of each sample was evaluated in random order by three judges for a total of 120 observations. Photographs were compared with one of a clean denture sample. Statistical analysis of the results showed that soaking dentures in sodium hypochloride and Savlon(R) removed significantly more contaminants than any of the other methods used in this study.