Publication:
A signal processing model for time series analysis: The effects of international F/X markets on domestic currencies using wavelet networks

dc.contributor.authorsCifter A., Ozun A.
dc.date.accessioned2022-03-28T14:55:27Z
dc.date.accessioned2026-01-10T19:08:16Z
dc.date.available2022-03-28T14:55:27Z
dc.date.issued2008
dc.description.abstractThis paper proposes a powerful methodology wavelet networks to investigate the effects of international F/X markets on emerging markets currencies. We used EUR/USD parity as input indicator (international F/X markets) and three emerging markets currencies as output indicator (emerging markets currency). We test if the effects of international F/X markets change across different timescale. Using wavelet networks, it is found that the effects of international F/X markets increase with higher timescale. This evidence shows that the causality of international F/X markets on emerging markets should be tested based on 32-64 days effect. We also find that the effects of EUR/USD parity on Turkish Lira is higher on 9-16 days and 33-64 days scales and this evidence shows that Turkish lira is less stable compare to other emerging markets currencies as international F/X markets effects Turkish lira on shorten time scale. Besides it is found that Russian ruble is mostly affected from international F/X market in the long time according to wavelet networks analysis. Copyright © 2008 Praise Worthy Prize S.r.l. - All rights reserved.
dc.identifier.issn18276660
dc.identifier.urihttps://hdl.handle.net/11424/256253
dc.language.isoeng
dc.publisherPraise Worthy Prize S.r.l
dc.relation.ispartofInternational Review of Electrical Engineering
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectFX markets
dc.subjectNeural networks
dc.subjectSignal processing
dc.subjectWavelet networks
dc.titleA signal processing model for time series analysis: The effects of international F/X markets on domestic currencies using wavelet networks
dc.typearticle
dspace.entity.typePublication
oaire.citation.endPage591
oaire.citation.issue3
oaire.citation.startPage580
oaire.citation.titleInternational Review of Electrical Engineering
oaire.citation.volume3

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