Publication:
Analysis of positron lifetime spectra using Bayesian inference

dc.contributor.authorsUstundag D., Cevri M., Yahsi U.
dc.date.accessioned2022-03-15T02:10:48Z
dc.date.accessioned2026-01-11T17:42:10Z
dc.date.available2022-03-15T02:10:48Z
dc.date.issued2015
dc.description.abstractPositron annihilation is a well-established technique for producing spectra which can be analyzed for extracting physically meaningful parameters that characterize material defects and vacancies on an atomic scale. Mathematically, this is based on fitting a parameter-dependent model to the experimental data. Traditionally, this fit involves local nonlinear optimization routines that depend on a reasonable initial guess for the searched parameters. Therefore, very different sets of parameters may yield indistinguishably good fits for a given experimental spectrum but, give rise to ambiguities in data analysis. In order to alleviate them, a computer program has been developed for analyzing positron lifetime spectra by incorporating a global nonlinear optimization routine based on Simulated annealing (SA) into the Markov chain Monte-Carlo Bayesian inference algorithm (MCMC-BI) so that it provides a robust fitting tool and yields information on the reliability of the results. It is tested against experimental spectra, comparing the results with those from the well-established commercial programs.
dc.identifier.doi10.1049/cp.2015.1755
dc.identifier.isbn9781785611360; 9781785611360
dc.identifier.urihttps://hdl.handle.net/11424/247579
dc.language.isoeng
dc.publisherInstitution of Engineering and Technology
dc.relation.ispartofIET Conference Publications
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectBayesian inference
dc.subjectLifetime spectra
dc.subjectMarkov chain Monte Carlo
dc.subjectOptimization
dc.subjectPositron annihilation
dc.subjectSimulated annealing
dc.titleAnalysis of positron lifetime spectra using Bayesian inference
dc.typeconferenceObject
dspace.entity.typePublication
oaire.citation.issueCP670
oaire.citation.titleIET Conference Publications
oaire.citation.volume2015

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