Publication:
Complex permittivity determination only with reflection coefficient in partially filled waveguides

dc.contributor.authorAYDOĞAN, AHMET
dc.contributor.authorsAydogan, Ahmet; Akinci, M. N.; Akleman, Funda
dc.date.accessioned2022-03-12T22:25:16Z
dc.date.accessioned2026-01-11T07:59:07Z
dc.date.available2022-03-12T22:25:16Z
dc.date.issued2018
dc.description.abstractIn this study, dielectric measurement of homogeneous materials partially loaded in rectangular waveguides is presented utilizing multi-frequency reflection coefficient (Gamma(M)) data measured via a vector network analyser. The relation between Gamma(M )and the complex permittivity of the material, of which the frequency behavior in the considered band is analytically modelled with a one-pole Debye relaxation model, is constructed through integral equations associated with the Dyadic Green's function of the hollow waveguide. The integral equations are then inverted to determine the complex permittivity via a root search routine based on the multivariate Newton-Raphson method, which is applied to calculate the model parameters valid for the considered frequency band. Finally, sensitivity and convergence analysis are performed for different scenarios.
dc.identifier.doi10.1088/1361-6501/aadcbc
dc.identifier.eissn1361-6501
dc.identifier.issn0957-0233
dc.identifier.urihttps://hdl.handle.net/11424/234898
dc.identifier.wosWOS:000446789000001
dc.language.isoeng
dc.publisherIOP PUBLISHING LTD
dc.relation.ispartofMEASUREMENT SCIENCE AND TECHNOLOGY
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectdielectric measurement
dc.subjectmethod of moments
dc.subjectmulti-frequency data
dc.subjectreflection coefficient
dc.subjectwaveguide measurements
dc.subjectMICROWAVE-FREQUENCIES
dc.subjectDIELECTRIC-PROPERTIES
dc.subjectPERMEABILITY
dc.subjectFDTD
dc.titleComplex permittivity determination only with reflection coefficient in partially filled waveguides
dc.typearticle
dspace.entity.typePublication
oaire.citation.issue11
oaire.citation.titleMEASUREMENT SCIENCE AND TECHNOLOGY
oaire.citation.volume29

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