Publication:
Examining Thread Vulnerability Analysis Using Fault-Injection

dc.contributor.authorsOz, Isil; Topcuoglu, Haluk Rahmi; Kandemir, Mahmut; Tosun, Oguz
dc.contributor.editorMargala, M
dc.contributor.editorReis, R
dc.contributor.editorOrailoglu, A
dc.contributor.editorCarro, L
dc.contributor.editorSilveira, LM
dc.contributor.editorUgurdag, HF
dc.date.accessioned2022-03-12T16:14:21Z
dc.date.accessioned2026-01-11T18:34:58Z
dc.date.available2022-03-12T16:14:21Z
dc.date.issued2013
dc.description.abstractWith the scale down of transistor sizes and higher frequencies with low power modes in modern architectures, the chip components become more susceptible to transient errors. Concurrently, multicore machines are replacing traditional single-core machines in most application domains. Thread Vulnerability Factor (TVF) is a metric to evaluate relative soft error vulnerability of multithreaded applications running on multicore architectures. It makes possible vulnerability analysis of parallel programs by providing comparisons between them. In this work, we design a simulation-based fault-injection framework to evaluate soft error vulnerability of parallel applications and perform a validation study to evaluate parallel program vulnerability. The results of the simulation-based fault injection framework is compared with the results based on TVF analysis. Our results demonstrate that TVF provides an efficient vulnerability analysis by having the same ordering and similar vulnerability rates with fault-injection results for a set of multithreaded applications.
dc.identifier.doidoiWOS:000332046100047
dc.identifier.isbn978-1-4799-0522-5; 978-1-4799-0524-9
dc.identifier.urihttps://hdl.handle.net/11424/225330
dc.identifier.wosWOS:000332046100047
dc.language.isoeng
dc.publisherIEEE
dc.relation.ispartof2013 IFIP/IEEE 21ST INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION (VLSI-SOC)
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.titleExamining Thread Vulnerability Analysis Using Fault-Injection
dc.typeconferenceObject
dspace.entity.typePublication
oaire.citation.endPage245
oaire.citation.startPage240
oaire.citation.title2013 IFIP/IEEE 21ST INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION (VLSI-SOC)

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