Publication:
A Screen-Printed Nickel Based Resistance Temperature Detector (RTD) on Thin Ceramic Substrate

dc.contributor.authorsTurkani, Vikram S.; Maddipatla, Dinesh; Narakathu, Binu B.; Altay, Bilge N.; Fleming, Dan; Bazuin, Bradley J.; Atashbar, Massood Z.
dc.date.accessioned2022-03-12T16:24:38Z
dc.date.accessioned2026-01-11T17:29:56Z
dc.date.available2022-03-12T16:24:38Z
dc.date.issued2020
dc.description.abstractA flexible nickel (Ni) based resistance temperature detector (RTD) was successfully fabricated for monitoring temperature in automobile and aerospace applications. The RTD was developed by screen printing Ni based ink on a flexible ceramic platform. The ability of the RTD to monitor temperatures varying from 25 degrees C to 200 degrees C, in steps of 25 degrees C was investigated. The results of the RTD demonstrated a linear response with resistive changes as high as 47.1% at 200 degrees C, when compared to its base resistance (20.2 k Omega) at 25 degrees C. A temperature coefficient of resistance (TCR) of 0.3%/degrees C, with a correlation coefficient of 0.9994 was calculated for the RTD. The response of the screen printed RTD is analyzed and presented in this paper.
dc.identifier.doidoiWOS:000603414900099
dc.identifier.isbn978-1-7281-5317-9
dc.identifier.issn2154-0357
dc.identifier.urihttps://hdl.handle.net/11424/226408
dc.identifier.wosWOS:000603414900099
dc.language.isoeng
dc.publisherIEEE
dc.relation.ispartof2020 IEEE INTERNATIONAL CONFERENCE ON ELECTRO INFORMATION TECHNOLOGY (EIT)
dc.relation.ispartofseriesInternational Conference on Electro Information Technology
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectceramic substrate
dc.subjectflexible
dc.subjectnickel
dc.subjectresistive temperature detector (RTD)
dc.subjectscreen printing
dc.subjectSELECTIVE DETECTION
dc.subjectSENSOR
dc.titleA Screen-Printed Nickel Based Resistance Temperature Detector (RTD) on Thin Ceramic Substrate
dc.typeconferenceObject
dspace.entity.typePublication
oaire.citation.endPage580
oaire.citation.startPage577
oaire.citation.title2020 IEEE INTERNATIONAL CONFERENCE ON ELECTRO INFORMATION TECHNOLOGY (EIT)

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