Publication:
Effect of solution molarity on microstructural and optical properties of CdCr2S4 thin films

dc.contributor.authorBOYRAZ, CİHAT
dc.contributor.authorsBoyraz, Cihat; Urfa, Yalcin
dc.date.accessioned2022-03-13T12:48:11Z
dc.date.accessioned2026-01-11T06:58:12Z
dc.date.available2022-03-13T12:48:11Z
dc.date.issued2015
dc.description.abstractTransparent conducting cadmium chromium sulfide [CdCr2S4, (CCS)] thin films with various precursor molarities were deposited onto Si (100) substrates by simple chemical bath deposition (CBD) process. X-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive X-ray analysis (EDX), atomic force microscope (AFM), and optical absorption techniques were used to characterize the coated CCS thin films. The XRD exhibits a reasonably crystalline cubic structure that defines the thin film patterns. The molar effect on film quality has also been investigated. The correlation between the molar effect, structural and optical properties reveals that the band gap energy of the thin films is influenced by the size of the crystallites composing the thin films. The roughness of CCS thin films and the roughness-precursor molarity dependence have been established by AFM measurements. Increasing grain size of CCS thin films leads to a shift in the band gap energy from 2.65 to 2.47 eV. The quantum confinement effect should be the reason for possible band gap energy shifts. (c) 2015 Elsevier Ltd. All rights reserved.
dc.identifier.doi10.1016/j.mssp.2015.03.021
dc.identifier.eissn1873-4081
dc.identifier.issn1369-8001
dc.identifier.urihttps://hdl.handle.net/11424/238175
dc.identifier.wosWOS:000355363600001
dc.language.isoeng
dc.publisherELSEVIER SCI LTD
dc.relation.ispartofMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectCdCr2S4 thin films
dc.subjectMicrostructure
dc.subjectBand gap energy shifts
dc.subjectCOLOSSAL MAGNETORESISTANCE
dc.subjectDEPOSITION
dc.titleEffect of solution molarity on microstructural and optical properties of CdCr2S4 thin films
dc.typearticle
dspace.entity.typePublication
oaire.citation.endPage6
oaire.citation.startPage1
oaire.citation.titleMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
oaire.citation.volume36

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