Publication:
How additive are the Fourier series in the sense of high dimensional model representation?

dc.contributor.authorsGulpinar, Caner; Baykara, N. A.; Demiralp, Metin
dc.contributor.editorDemiralp, M
dc.contributor.editorMikhael, WB
dc.contributor.editorCaballero, AA
dc.contributor.editorAbatzoglou, N
dc.contributor.editorTabrizi, MN
dc.contributor.editorLeandre, R
dc.date.accessioned2022-03-12T16:00:24Z
dc.date.accessioned2026-01-11T19:14:09Z
dc.date.available2022-03-12T16:00:24Z
dc.date.issued2008
dc.description.abstractThe focus of this work is to investigate the quality of High Dimensional Model Representation (HDMR) to Fourier series. Towards this end, we experimantate with various Fourier series which are constructed for known univariate functions. Although the investigations are kept univariate, the extension that we obtain here to multivariate cases seems to be straightfor-ward. This is because we use the additivity measurers whose conceptual structures do not change from one multivariance to another. The additiviy measurers are certain well-ordered functionals mapping from a Hilbert space of multi or univariate functions to the interval [0, 1] and their close-to-one values mean certain level of additivity and therefore higher qualities of truncated HDMR approximants. Hence, those entities are evaluated for certain known cases.
dc.identifier.doidoiWOS:000257948800029
dc.identifier.isbn978-960-6766-65-7
dc.identifier.urihttps://hdl.handle.net/11424/224664
dc.identifier.wosWOS:000257948800029
dc.language.isoeng
dc.publisherWORLD SCIENTIFIC AND ENGINEERING ACAD AND SOC
dc.relation.ispartofNEW ASPECTS OF MICROELECTRONICS, NANOELECTRONICS, OPTOELECTRONICS
dc.relation.ispartofseriesElectrical and Computer Engineering Series
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectmultivariate functions
dc.subjectFourier series
dc.subjectHigh Dimensional Model Representation
dc.subjectadditivity measurers
dc.titleHow additive are the Fourier series in the sense of high dimensional model representation?
dc.typeconferenceObject
dspace.entity.typePublication
oaire.citation.endPage+
oaire.citation.startPage183
oaire.citation.titleNEW ASPECTS OF MICROELECTRONICS, NANOELECTRONICS, OPTOELECTRONICS

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