Publication:
Layered semiconductor GeS: A metamaterial with extremely low refractive index

Thumbnail Image

Date

2016

Authors

Journal Title

Journal ISSN

Volume Title

Publisher

Institute of Electrical and Electronics Engineers Inc.

Research Projects

Organizational Units

Journal Issue

Abstract

Reflection and transmission optical spectra of layered semiconductor GeS are investigated. It is shown, that this semiconductor can be considered as natural metamaterial with extremely low, n=0.14, refractive index in wide spectral region, λ=0.8-1.0 μm. © 2015 IEEE.

Description

Keywords

effective refractive index, GeS, metamaterial structure, periodic layer, propagation

Citation

URI

https://hdl.handle.net/11424/247697

Collections

Araştırma Çıktıları

Endorsement

Review

Supplemented By

Referenced By