Publication:
Residual stress estimation of ceramic thin films by X-ray diffraction and indentation techniques

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dc.contributor.authorsAtar, E; Sarioglu, C; Demirler, U; Kayali, ES; Cimenoglu, H
dc.date.accessioned2022-03-12T17:17:28Z
dc.date.accessioned2026-01-11T13:15:09Z
dc.date.available2022-03-12T17:17:28Z
dc.date.issued2003
dc.description.abstractThe residual stresses in ceramic thin films obtained by the indentation method have been found to be three times higher than those of the X-ray diffraction method. This discrepancy can be eliminated by setting the geometrical factor for the Vickers pyramid indenter to 1 in the relevant equation of the indentation method. (C) 2003 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.
dc.identifier.doi10.1016/S1359-6462(03)00019-8
dc.identifier.issn1359-6462
dc.identifier.urihttps://hdl.handle.net/11424/227846
dc.identifier.wosWOS:000181890700019
dc.language.isoeng
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.relation.ispartofSCRIPTA MATERIALIA
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectmicroindentation
dc.subjectresidual stresses
dc.subjectthin films
dc.subjectX-ray diffraction
dc.subjectSHARP INDENTATION
dc.subjectSTRAIN FIELDS
dc.subjectSURFACE
dc.subjectTIN
dc.titleResidual stress estimation of ceramic thin films by X-ray diffraction and indentation techniques
dc.typearticle
dspace.entity.typePublication
oaire.citation.endPage1336
oaire.citation.issue9
oaire.citation.startPage1331
oaire.citation.titleSCRIPTA MATERIALIA
oaire.citation.volume48

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