Publication:
PIXE, Particle Induced X-ray Emission a concise review

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Date

1998

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SCIENTIFIC TECHNICAL RESEARCH COUNCIL TURKEY

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Abstract

PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-destructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.

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Keywords

particle induced X-ray emission, elemental analysis, trace element, ion induced X-ray, HEAVY CHARGED-PARTICLES, SHELL COULOMB IONIZATION, TRACE-ELEMENT ANALYSIS, CROSS-SECTIONS, K-SHELL

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https://hdl.handle.net/11424/226628

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