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PIXE, Particle Induced X-ray Emission a concise review

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dc.contributor.authorsGarip, AI
dc.date.accessioned2022-03-12T16:55:59Z
dc.date.accessioned2026-01-10T18:35:29Z
dc.date.available2022-03-12T16:55:59Z
dc.date.issued1998
dc.description.abstractPIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-destructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.
dc.identifier.doidoiWOS:000074905000001
dc.identifier.issn1010-7614
dc.identifier.urihttps://hdl.handle.net/11424/226628
dc.identifier.wosWOS:000074905000001
dc.language.isoeng
dc.publisherSCIENTIFIC TECHNICAL RESEARCH COUNCIL TURKEY
dc.relation.ispartofTURKISH JOURNAL OF CHEMISTRY
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectparticle induced X-ray emission
dc.subjectelemental analysis
dc.subjecttrace element
dc.subjection induced X-ray
dc.subjectHEAVY CHARGED-PARTICLES
dc.subjectSHELL COULOMB IONIZATION
dc.subjectTRACE-ELEMENT ANALYSIS
dc.subjectCROSS-SECTIONS
dc.subjectK-SHELL
dc.titlePIXE, Particle Induced X-ray Emission a concise review
dc.typearticle
dspace.entity.typePublication
oaire.citation.endPage199
oaire.citation.issue3
oaire.citation.startPage183
oaire.citation.titleTURKISH JOURNAL OF CHEMISTRY
oaire.citation.volume22

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